Anterwell Technology Ltd.
Large Original stock of IC Electronics Components, Transistors, Diodes etc.
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DC Supply Voltage: | -0.5 To 7.0 V | DC Input Voltage: | -0.5 ≤ VI ≤ 7.0 V |
---|---|---|---|
DC Output Voltage: | -0.5 ≤ VO ≤ 7.0 V | DC Input Diode Current: | -50 MA |
DC Output Diode Current: | -50 MA | Storage Temperature: | -65 To 150 °C |
Highlight: | electronic integrated circuit,linear integrated circuits |
NL17SZ17
Single Non−Inverting Buffer with Schmitt Trigger
The NL17SZ17 is a single Non−inverting Schmitt Trigger Buffer in two tiny footprint packages. The device performs much as LCX multi−gate products in speed and drive.
Features
• Tiny SOT−353 and SOT−553 Packages
• Source/Sink 24 mA at 3.0 Volts
• Overvoltage Tolerant Inputs and Outputs
• Chip Complexity: FETs = 20
• Designed for 1.65 V to 5.5 V VCC Operation
• Pb−Free Packages are Available
MAXIMUM RATINGS
Symbol | Parameter | Value | Unit |
---|---|---|---|
VCC | DC Supply Voltage | -0.5 to 7.0 V | V |
VI | DC Input Voltage | -0.5 ≤ VI ≤ 7.0 V | V |
VO | DC Output Voltage Output in High or LOW State (Note 1) | -0.5 ≤ VO ≤ 7.0 | V |
IIK | DC Input Diode Current VI < GND | -50 | mA |
IOK | DC Output Diode Current VO < GND | -50 | mA |
IO | DC Output Sink Current | ±50 | mA |
ICC | DC Supply Current per Supply Pin | ±100 | mA |
IGND | DC Ground Current per Ground Pin | ±100 | mA |
TSTG | Storage Temperature Range | -65 to 150 | °C |
TL | Lead Temperature, 1 mm from Case for 10 Seconds | 260 | °C |
TJ | Junction Temperature under Bias | +150 | °C |
θJA |
Thermal Resistance SOT−353 (Note 2) SOT−553 |
350 496 |
°C/W |
PD |
Power Dissipation in Still Air at 85°C SOT−353 SOT−553 |
186 135 |
mW |
MSL | Moisture Sensitivity | Level 1 | |
FR | Flammability Rating Oxygen Index: 28 to 34 | UL 94 V−0 @ 0.125 in | |
ILatchup |
Latchup Performance Above VCC and Below GND at 85°C (Note 6) |
±500 | mA |
ESD |
ESD Classification Human Body Model (Note 3) Machine Model (Note 4) Charged Device Model |
Class IC Class A N/A |
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
3. Tested to EIA/JESD22−A114−A, rated to EIA/JESD22−A114−B.
4. Tested to EIA/JESD22−A115−A, rated to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
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